EC Epiplan-Neofluar objectives –
Outstanding contrast and excellent imaging – all provided by the EnhancedContrast Epiplan-Neofluars. Based on ICS optics, these objectives offer the finest quality available. For example, with long working distances and high numerical apertures – ideal for easy manipulation and high-resolution struc-tures. Rich contrast makes these objectives perfect for capturing clear, sharp images for post processing and subsequent analysis. An outstanding basis for the use of high-resolution digital cameras.

TIC – Advances in measurement
Totally new standards in measuring techniques – with the help of circular light polarization, it is easy to measure step heights, whereby the inter-fer-ence pattern direction can be adapted to the specimen (see figures). With a measuring range of about 5 µm. With clearly defined levels, precision up to 20 nm may be achieved! TIC – Total Interference Contrast: an innovative technique, easy to use and attractive in price.

C-DIC – High-contrast innovation
An innovation you can see – Axio Observer MAT offers a new optical polarization technique that operates with circular polarized light (Circular DIC) in contrast to conventional DIC. Trend-setting in materials microscopy, circular polarization with DIC solves a familiar imaging problem. With the innovative C-DIC technique, sample structures that used to be visible only in a certain direction can now be seen in their entirety – regardless of their orientation and without rotating the sample stage. You simply adjust the knob on the DIC slider for complete and high-contrast imaging of all specimen structures. You will appreciate what this means for you: information about the specimen is complete and visible, contrasts are sharper – and your workflow is substantially more efficient.